These images are of a selective area of AlGaN (aluminum gallium nitride) nanostructures on graphene. Images were captured using the Field Emission Scanning Electron Microscope, FESEM, at MEE in support of a project partnership between CrayoNano AS of Norway and Agnitron Technology of Eden Prairie, MN USA.

The FESEM is an advanced microscope offering increased magnification and the ability to observe very fine features at a lower voltage than the SEM found in most laboratories.  Just as important as having the right tools for the job is having an experienced operator who can use the microscope to reveal the best images. Kudos to Kurt Schenk, MEE Laboratory Manager, for his work on this fascinating project.