The Field Emission Scanning Electron Microscope (FESEM) has a much brighter electron source and smaller beam size than a typical SEM increasing the useful magnification of observation and imaging up to 500,000x. A second advantage of the FESEM is that high resolution imaging can be performed with very low accelerating voltages. This enhances the observation of very fine surface features, electron beam sensitive materials, and non-conductive materials. The FESEM is ideal for imaging polymer materials and thin films.
